G. Harzheim et al., Colossal magnetoresistance of thin films of La0.66Ba0.33MnO3 as a functionof film thickness, MAT SCI E B, 56(2-3), 1998, pp. 147-151
La0.66Ba0.33MnO3 shows a strong change of its resistivity if a magnetic fie
ld is applied. The strength of this colossal magneto resistance (CMR) effec
t depends of the thickness of epitaxial thin films prepared on MgO (100) an
d SrTiO3, (100). We have prepared films in a thickness range of 5 to 250 nm
by pulsed laser deposition. The epitaxial La0.66Ba0.33MnO3 thin films were
characterized by Rutherford backscattering spectrometry and channeling, X-
ray diffraction measurements as well as by high resolution transmission ele
ctron microscopy (HRTEM). The high crystalline quality was proved by ion ch
anneling (minimum yield of chi(min) approximate to 2%) and by HRTEM microgr
aphs. By X-ray diffraction measurements, no additional phases were detected
beside the cubic phase with a lattice constant a = 3.915 Angstrom. The CMR
effect of 10 nm thin films is enlarged by 45% as compared to 150 nn thick
films on MgO (100) substrates. The saturation magnetization decreases with
decreasing film thickness. (C) 1998 Elsevier Science S.A. All rights reserv
ed.