Characterization of etch pits and correlated defects in ZnSe/(001)GaAs

Authors
Tanaka, S Goto, T Hibino, M
Citation
S. Tanaka et al., Characterization of etch pits and correlated defects in ZnSe/(001)GaAs, MICROSC RES, 43(6), 1998, pp. 518-519
Citations number
6
Categorie Soggetti
Multidisciplinary
Journal title
MICROSCOPY RESEARCH AND TECHNIQUE
ISSN journal
1059910X → ACNP
Volume
43
Issue
6
Year of publication
1998
Pages
518 - 519
Database
ISI
SICI code
1059-910X(199812)43:6<518:COEPAC>2.0.ZU;2-H