Detection of delta-electron events in charge coupled devices: a fingerprint of single swift heavy ions

Citation
Mm. Meier et al., Detection of delta-electron events in charge coupled devices: a fingerprint of single swift heavy ions, NUCL INST B, 146(1-4), 1998, pp. 601-606
Citations number
11
Categorie Soggetti
Spectroscopy /Instrumentation/Analytical Sciences","Instrumentation & Measurement
Journal title
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS
ISSN journal
0168583X → ACNP
Volume
146
Issue
1-4
Year of publication
1998
Pages
601 - 606
Database
ISI
SICI code
0168-583X(199812)146:1-4<601:DODEIC>2.0.ZU;2-5
Abstract
Charge Coupled Devices, an arrangement of a few 100 000 photo-electric cell s on a plane, allow the spatially and temporally resolved detection of sing le swift heavy ions and delta-electrons emitted by projectile-target-intera ctions from a target foil mounted at a distance of 500 mu m above the micro chip. This detector system is read out by standard TV technique and the sig nal is digitized for further processing by image analysis. The delta-electr ons can be observed as a halo around the hit of the ion on the correspondin g TV frame. The appearance of these halos is determined by the ion paramete rs velocity and effective charge. Vice versa the delta-electron halos provi de information on the projectile within the bounds of the delta-electron st atistics. This effect has been described in detail by an appropriate nuclea r track structure model, which comprises production, transport and detectio n of delta-electrons as independent processes. First model calculations hav e been confirmed by experimental data. (C) 1998 Elsevier Science B.V. All r ights reserved.