Spontaneous emission into planar multi-dielectric microcavities: Theoretical and experimental analysis of rare earth ion radiations

Citation
H. Rigneault et al., Spontaneous emission into planar multi-dielectric microcavities: Theoretical and experimental analysis of rare earth ion radiations, OPT MATER, 11(2-3), 1999, pp. 167-180
Citations number
19
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science","Material Science & Engineering
Journal title
OPTICAL MATERIALS
ISSN journal
09253467 → ACNP
Volume
11
Issue
2-3
Year of publication
1999
Pages
167 - 180
Database
ISI
SICI code
0925-3467(199901)11:2-3<167:SEIPMM>2.0.ZU;2-3
Abstract
Spontaneous emission control for rare earth ions implanted inside planar mu ltidielectric microcavities is investigated theoretically and experimentall y. Rigorous classical electrodynamics analyses are presented and compared i n order to compute the electromagnetic power provided by sources located in side planar dielectric multilayer structures. Radiation patterns and lifeti me measurements are performed in Ta2O5/SiO2 microcavities implanted with er bium and praseodymium ions. Although we demonstrate a significant enhanceme nt of the spontaneous emission in a direction normal to the layer (up to 30 %), we show that a large amount of the emitted power is carried by the guid ed modes of the structures. (C) 1999 Elsevier Science B.V. All rights reser ved.