Resonances in GaAs/AlxGa1-xAs heterojunctions due to Si shallow donors related protrusions

Citation
Lo. Oliveira et al., Resonances in GaAs/AlxGa1-xAs heterojunctions due to Si shallow donors related protrusions, PHYS ST S-B, 210(2), 1998, pp. 683-687
Citations number
5
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
PHYSICA STATUS SOLIDI B-BASIC RESEARCH
ISSN journal
03701972 → ACNP
Volume
210
Issue
2
Year of publication
1998
Pages
683 - 687
Database
ISI
SICI code
0370-1972(199812)210:2<683:RIGHDT>2.0.ZU;2-W
Abstract
We investigate the role of protrusions due to individual Si shallow donors on the electron transmission properties through GaAs/AlxGa1-xAs heterojunct ions. Our theoretical calculations show that the protrusions can change rem arkably the electron transmission properties, being even capable of produci ng resonances. The modifications on the electron transmission are stronger when the individual dopant is localized in the AlxGa1-xAs alloy side, but t hey also depend how far is the individual dopant from the GaAs/AlxGa1-xAs h eterojunction interface. When the existence of two simultaneous individual dopants is considered, the electron transmission can present more than one resonance peak.