Coarsening dynamics of crystalline thin films

Authors
Citation
M. Siegert, Coarsening dynamics of crystalline thin films, PHYS REV L, 81(25), 1998, pp. 5481-5484
Citations number
30
Categorie Soggetti
Physics
Journal title
PHYSICAL REVIEW LETTERS
ISSN journal
00319007 → ACNP
Volume
81
Issue
25
Year of publication
1998
Pages
5481 - 5484
Database
ISI
SICI code
0031-9007(199812)81:25<5481:CDOCTF>2.0.ZU;2-H
Abstract
The formation of pyramidlike structures in thin-film growth on substrates w ith a quadratic symmetry, e.g., {001} surfaces, is shown to exhibit anisotr opic scaling as there exist two length scales with different time dependenc es. Numerical results indicate that for most realizations coarsening of mou nds is described by an exponent n similar or equal to 1/4. However, dependi ng on material parameters it is shown that n may lie between 0 (logarithmic coarsening) and 1/3. In contrast, growth on substrates with triangular sym metries ({111} surfaces) is dominated by a single length similar to t(1/3).