Evolution of surface morphology of vicinal Si(111) surfaces after aluminumdeposition

Citation
C. Schwennicke et al., Evolution of surface morphology of vicinal Si(111) surfaces after aluminumdeposition, SURF SCI, 418(1), 1998, pp. 22-31
Citations number
48
Categorie Soggetti
Physical Chemistry/Chemical Physics
Journal title
SURFACE SCIENCE
ISSN journal
00396028 → ACNP
Volume
418
Issue
1
Year of publication
1998
Pages
22 - 31
Database
ISI
SICI code
0039-6028(19981127)418:1<22:EOSMOV>2.0.ZU;2-A
Abstract
We have studied changes in surface morphology of vicinal Si(111) surfaces w ith a miscut of 1.3 degrees in the [(2) over bar 11] direction after Al dep osition at elevated temperatures. The clean surface phase separates into a (111)-oriented phase and a stepped phase. Submonolayer Al deposition at 650 degrees C, the normal preparation temperature of the Al/Si(111)-(root 3 x root 3)R30 degrees structure, only induces minor changes in the surface mor phology. However, after Al deposition at temperatures above the order-disor der phase transition temperature, the step bunches break apart into a unifo rm array of single height steps with an average step-step separation determ ined by the macroscopic miscut. From a quantitative analysis of the amount of meandering of steps and the terrace width distribution, we determined th e diffusivity of steps and the strength of the repulsive step-step interact ion. The repulsive interaction between steps is enhanced by the Al adsorpti on compared to both the high-temperature (1 x 1) and (7 x 7) phases of the clean surface. (C) 1998 Elsevier Science B.V. All rights reserved.