Fm. Houlihan et al., A RETROSPECTIVE ON 2-NITROBENZYL SULFONATE PHOTOACID GENERATORS, Journal of imaging science and technology, 41(1), 1997, pp. 35-40
An overview on the utility of 8-nitrobenzyl sulfonate photoacid genera
tors (FAG) in chemically amplified deep UV (248 nm) photoresists is pr
esented. This article will detail how structural changes in photoacid
generators affect properties such as quantum yield, thermal stability,
etc., and will also illustrate how these properties influence the lit
hographic characteristics of photoresist formulations.