Scanning probe microscopy study of the metal-rich layered chalcogenides TaM2Te2 (M = Co, Ni)

Authors
Neuhausen, J Evstaf'iev, VK Block, T Finckh, EW Tremel, W Augustin, L Fuchs, H Voss, D Kruger, P Mazur, A Pollmann, J
Citation
J. Neuhausen et al., Scanning probe microscopy study of the metal-rich layered chalcogenides TaM2Te2 (M = Co, Ni), CHEM MATER, 10(12), 1998, pp. 3870-3878
Citations number
30
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science","Material Science & Engineering
Journal title
CHEMISTRY OF MATERIALS
ISSN journal
08974756 → ACNP
Volume
10
Issue
12
Year of publication
1998
Pages
3870 - 3878
Database
ISI
SICI code
0897-4756(199812)10:12<3870:SPMSOT>2.0.ZU;2-E
Abstract
The compounds TaNi2Te2 and TaCo2Te2 have been examined by scanning tunnelin g and atomic force microscopy. The title phases crystallize in layered stru ctures with metal slabs sandwiched by tellurium atoms. Scanning probe micro scope images of the surfaces of these materials arise from the surface tell urium atoms and-depending on the experimental conditions-can show very diff erent features. The images have been simulated through surface charge densi ties calculated within the Extended Huckel and LMTO frameworks.