FIELD-ION IMAGING OF A TUNGSTEN SUPERTIP

Citation
T. Miller et al., FIELD-ION IMAGING OF A TUNGSTEN SUPERTIP, Applied physics A: Materials science & processing, 61(1), 1995, pp. 99-100
Citations number
3
Categorie Soggetti
Physics, Applied
ISSN journal
09478396
Volume
61
Issue
1
Year of publication
1995
Pages
99 - 100
Database
ISI
SICI code
0947-8396(1995)61:1<99:FIOATS>2.0.ZU;2-X
Abstract
For the first time, a supertip on a [111] W base tip has been self-ima ged by field-ion microscopy with atomic resolution. It is a tiny cryst alline protrusion of a few nm in diameter.