FD-TD analysis of coaxial probes inserted into rectangular waveguides

Citation
A. Sanada et al., FD-TD analysis of coaxial probes inserted into rectangular waveguides, IEICE TR EL, E81C(12), 1998, pp. 1821-1830
Citations number
15
Categorie Soggetti
Eletrical & Eletronics Engineeing
Journal title
IEICE TRANSACTIONS ON ELECTRONICS
ISSN journal
09168524 → ACNP
Volume
E81C
Issue
12
Year of publication
1998
Pages
1821 - 1830
Database
ISI
SICI code
0916-8524(199812)E81C:12<1821:FAOCPI>2.0.ZU;2-6
Abstract
Full-wave FD-TD analysis has been carried out for coaxial probes inserted i nto waveguides. Both single and symmetrically placed paired coaxial probe s tructures have been discussed and we have revealed the relation between equ ivalent circuit parameters and structural parameters of the coaxial probes including cases for large diameter and extension length, which is useful fo r practical waveguide circuit design. The equivalent circuit parameters cal culated from the scattering parameters agreed well with corresponding measu red data. From the calculated field in a waveguide, field concentration at sharp edges of probe sole or base, which ought to be taken into account for high power application design has been also discussed. Besides, amplitudes of higher order modes in waveguides excited by coaxial probes or pairs of coaxial probes has been calculated so as to estimate the range beyond which higher order modes decay sufficiently. This estimation is necessary for si mple and easy design of probe using circuit theory.