X-ray diffraction analysis of a brass film formed by deposition of a copper film, a zinc film and intermetallic diffusion

Citation
B. Bolle et al., X-ray diffraction analysis of a brass film formed by deposition of a copper film, a zinc film and intermetallic diffusion, J PHYS IV, 8(P5), 1998, pp. 69-76
Citations number
15
Categorie Soggetti
Physics
Journal title
JOURNAL DE PHYSIQUE IV
ISSN journal
11554339 → ACNP
Volume
8
Issue
P5
Year of publication
1998
Pages
69 - 76
Database
ISI
SICI code
1155-4339(199810)8:P5<69:XDAOAB>2.0.ZU;2-9
Abstract
Layers of binary alloys (brass, bronze,...) are usually electroplated from cyanides baths. This technique allows high rates of deposition and works sa fely, but there are some risks in using cyanides. Therefore new ways of ele ctro-deposition are investigated. One manufacturing process consists of suc cessively depositing the two metals and of obtaining inter-metallic diffusi on by heating the bilayer. Usually, it is essential to know the exact phase s and their proportions, in order to control the deposition and diffusion p rocesses. In this study, are presented X ray diffraction methods to control the layer. As an example, analysis of a brass layer obtained by sequential plating plus diffusion process is given.