Citation
B. Pardo et al., X-ray reflectometry of cermet films, J PHYS IV, 8(P5), 1998, pp. 223-229
Citations number
14
Categorie Soggetti
Physics
Journal title
JOURNAL DE PHYSIQUE IV
ISSN journal
11554339
→ ACNP
Volume
8
Issue
P5
Year of publication
1998
Pages
223 - 229
Database
ISI
SICI code
1155-4339(199810)8:P5<223:XROCF>2.0.ZU;2-X
Abstract
The grazing angle X-ray reflection by a nanocermet of cosputtered platinium
and alumine are studied. Some possible models are discussed such as the sc
attering by nano spherical clusters, the angle dependent index and the beha
viour as an homogeneous medium. It is shown that the last approximation is
valid when the grazing angle is small.