Characterization and chemical speciation at the micrometric level using synchrotron radiation

The advent of synchrotron radiation and the enormous development of X-ray o ptics made it possible the realization of photon microprobes. Micrometer si ze hard X-ray beams can be obtained through various arrangement and the flu x is intense enough to undertake elemental mapping of trace elements. Assoc iated with microdiffraction or with X-ray Absorption Near Edge Structure, t hese microprobes will become a very interesting tool for material character ization.