D. Liufu et Kc. Kao, Capacitance transient spectroscopy in metal-insulator-metal systems and its application to the determination of trap parameters in polyimide films, J APPL PHYS, 85(2), 1999, pp. 1089-1094
The capacitance of a metal-insulator-metal system with the presence of a sp
ace charge in the insulator has been derived under various conditions. On t
he basis of the transient behavior of the capacitance as a function of the
applied voltage and temperature, trap parameters in an insulator can be det
ermined. Polyimide films were used to demonstrate the use of this capacitan
ce transient spectroscopy for the determination of the concentrations of th
e originally existing traps as well as the new traps created by dissociativ
e trapping of carriers injected from the electrical contact at high fields.
(C) 1999 American Institute of Physics. [S0021-8979(99)03201-6].