A. Kikitsu et al., Kerr effect enhancement by photon tunneling and possible application to a new scanning probe magnetic microscope, J APPL PHYS, 83(11), 1998, pp. 6232-6234
Magneto-optical effects are calculated fur the film stack consisting of hem
isphere glass/magnetic him (10 nm)/air gap (d nm)/glass plate. Polarized li
ght (wave length = 800 nm) is irradiated through the hemisphere glass in th
e total internal reflection configuration. A typical amorphous rare earth-t
ransition metal alloy is used for the magnetic layer. We find a large monot
onic change in the figure of merit (product of the reflected amplitude of l
ight and the Kerr rotation angle) as a function of the air gap, ranging fro
m 1 to 800 nm, Similar results are obtained for a magnetic film with a 10 n
m SiO2 protective layer and for a 1-nm-thin magnetic film, This phenomenon
is mostly caused by a change in the reflectivity at magnetic film/air inter
face due to photon tunneling. The difference in the figure of merit between
perpendicular and longitudinal magnetization is about 0.6 degrees. These r
esults imply that it might be possible to obtain an image of perpendicular
magnetic moment with photon scanning tunnel microscopy (STM), This method c
an be combined simultaneously with a conventional atomic force microscope o
r STM, (C) 1998 American Institute of Physics. [S0021-8979(98)53511-6].