A tertiary crystal growth method was used to fabricate thin gauged 3% Si-Fe
sheets in order to reduce the thickness of the sheets without deterioratin
g soft magnetic properties. During the investigation, the magnetic properti
es of final annealed sheets were found to be directly related to the magnet
ic properties of final cold rolled sheets. X-ray and transmission electron
microscopy were used to understand the above relation. It was found that th
e fraction of (110) grains at the surface of the final cold rolled sheets s
ignificantly affected the final magnetic properties of the final annealed s
heets. On the basis of the above argument, the final magnetic properties of
the thin gauged Si-Fe sheets can be predicted by the B-10 values of the fi
nal cold rolled sheets. (C) 1998 American Institute of Physics. [S0021-8979
(98)34811-2].