Citation
T. Takahashi et al., Structural and magnetic properties of FexSey thin films during their selenization process, J APPL PHYS, 83(11), 1998, pp. 6533-6535
Citations number
8
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
JOURNAL OF APPLIED PHYSICS
ISSN journal
00218979
→ ACNP
Volume
83
Issue
11
Year of publication
1998
Part
2
Pages
6533 - 6535
Database
ISI
SICI code
0021-8979(19980601)83:11<6533:SAMPOF>2.0.ZU;2-U
Abstract
FexSey films were prepared on GaAs(001) substrates by a selenization of Fe
films using molecular beam epitaxy equipment. Structural and magnetic prope
rties of FexSey thin films during their selenization process were studied.
The selenized films obtained consisted of polycrystalline grains of 100-700
nm. A magnetic anisotropy of in-plane/perpendicular to the films was weake
ned by increasing the selenization ratio of the samples, which was interest
ing in contrast to the fact that the grain size of the films became larger.
(C) 1998 American Institute of Physics. [S0021-8979(98)43711-3].