(Co1-xFex)Pt films were grown on a glass substrate by a rf sputtering and t
hen annealed at 650-700 degrees C in a high vacuum. All the as-sputtered (C
o1-xFex)Pt films deposited below 400 degrees C had a disordered structure a
nd showed very low coercivities. With increasing the deposition temperature
and Fe contents, the (111) texture was weakened in as-deposited (Co1-xFex)
Pt ternary filIns. Vibrating sample magnetometer and x-ray diffraction data
show that Co atoms in the L1(o) CoPt phase were substituted with Fe atoms.
In-plane coercivities of these films decreased almost linearly with increa
sing Fe content which seemed to be due to the decrease of a crystalline ani
sotropy energy. (C) 1998 American Institute of Physics.