Temperature dependence of ferromagnetic resonance as induced by NiO pinning layers

Citation
P. Lubitz et al., Temperature dependence of ferromagnetic resonance as induced by NiO pinning layers, J APPL PHYS, 83(11), 1998, pp. 6819-6821
Citations number
10
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
JOURNAL OF APPLIED PHYSICS
ISSN journal
00218979 → ACNP
Volume
83
Issue
11
Year of publication
1998
Part
2
Pages
6819 - 6821
Database
ISI
SICI code
0021-8979(19980601)83:11<6819:TDOFRA>2.0.ZU;2-K
Abstract
Ferromagnetic resonance (FMR) experiments have been conducted near 9.5 GHz on permalloy (Py) thin films which are components of spin valves and relate d structures. These so-called giant magnetoresistance structures often use antiferromagnetic NiO to achieve pinning of one magnetic layer. Magnetic an isotropies acting on these pinned layers were deduced by observing their re sonances for fields perpendicular to and in the sample plane. We used data taken from 4 to 600 K to identify potential mechanisms of pinning, anisotro py, and linewidth. The anisotropic exchange pinning and an isotropic downwa rd FMR shift vanish at a blocking temperature well below the bulk Neel temp erature of NiO. The strong temperature dependencies of the isotropic shift and linewidth may reflect the presence of different spin pinning subsystems and the different time scales of the FMR and low frequency or static measu rements.