Conversion electron Mossbauer studies on strontium ferrite films with in-plane and perpendicular anisotropies

Citation
A. Ajan et al., Conversion electron Mossbauer studies on strontium ferrite films with in-plane and perpendicular anisotropies, J APPL PHYS, 83(11), 1998, pp. 6879-6881
Citations number
8
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
JOURNAL OF APPLIED PHYSICS
ISSN journal
00218979 → ACNP
Volume
83
Issue
11
Year of publication
1998
Part
2
Pages
6879 - 6881
Database
ISI
SICI code
0021-8979(19980601)83:11<6879:CEMSOS>2.0.ZU;2-2
Abstract
Hexagonal strontium ferrite thin films with in-plane and perpendicular magn etic anisotropies have been studied using conversion electron Mossbauer spe ctroscopy. The hyperfine parameters of the films were found to be similar t o the one obtained for bulk strontium ferrite. However, the intensity ratio s of the first and second lines of the Mossbauer spectra were found to be d ifferent for films deposited at different rf powers. This indicated a chang e in the anisotropy of the deposited film. The resultant change in the magn etization direction and crystallization texture was compared to other measu rements, (C) 1998 American Institute of Physics. [S0021-8979(98)20111-3].