Influences on relaxation of exchange biasing in NiO/Ni66Co18Fe16 bilayers

Citation
Paa. Van Der Heijden et al., Influences on relaxation of exchange biasing in NiO/Ni66Co18Fe16 bilayers, J APPL PHYS, 83(11), 1998, pp. 7207-7209
Citations number
11
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
JOURNAL OF APPLIED PHYSICS
ISSN journal
00218979 → ACNP
Volume
83
Issue
11
Year of publication
1998
Part
2
Pages
7207 - 7209
Database
ISI
SICI code
0021-8979(19980601)83:11<7207:IOROEB>2.0.ZU;2-N
Abstract
The stability of the exchange biasing field, H-eb has been studied for NiO/ Ni66Co18Fe16 bilayers. A forced antiparallel alignment of the ferromagnetic magnetization to H-eb results in a gradual decrease and even a reversal of H-eb. The decrease of H-eb increases with temperature and is independent o f the external field and NiO layer thickness. This decrease can be interpre ted by a thermally assisted relaxation process. A new effect of the relaxat ion process on H-eb is demonstrated by using different cooling rates. (C) 1 998 American Institute of Physics.