(110) oriented growth was observed for thin films of the highly magnetostri
ctive Laves phases TbFe2 and DyFe2 on Ta (110). On Nb (111), TbFe2 nucleate
s in the (111) orientation. Depending on the substrate temperature during g
rowth, varying degrees of residual tensile strain were observed in the film
s. For TbFe2 grown on Ta (110) at 680 degrees C, x-ray diffraction revealed
a splitting of the (220) Bragg reflection into a strain free component str
ucturally coherent with the template, and a component with 0.5% biaxial ten
sile strain at room temperature. This strained component can be attributed
to the difference in thermal expansion between the sapphire substrate and t
he TbFe2 film. Magnetic hysteresis measurements revealed that the axis of e
asy magnetization lies in the film plane for both (110) and (111) oriented
samples. (C) 1998 American Institute of Physics. [S0021-8979(98)25411-9].