Trial on-silicon micromagnetoelastic devices

Citation
M. Takezawa et al., Trial on-silicon micromagnetoelastic devices, J APPL PHYS, 83(11), 1998, pp. 7303-7305
Citations number
9
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
JOURNAL OF APPLIED PHYSICS
ISSN journal
00218979 → ACNP
Volume
83
Issue
11
Year of publication
1998
Part
2
Pages
7303 - 7305
Database
ISI
SICI code
0021-8979(19980601)83:11<7303:TOMD>2.0.ZU;2-Q
Abstract
This paper discusses two new kinds of micromagnetoelastic devices made on s ilicon wafer whose function is to control the permeability of magnetostrict ive soft magnetic thin films by voltage-controlled elastic strain. One is p iezoelectric type and the other is electrostatic type. Structure, fabricati on process, characteristics, and maximum possible output are discussed. The feasibility of these devices has been clarified although the fate of obtai ned permeability change was less than 1%. These device characteristics coul d be improved to 11% for piezoelectric type and to 80% for electrostatic ty pe by the optimization of device dimensions and reduction of process damage to the magnetic film. (C) 1998 American Institute of Physics.