Semiparametric tests for double unit roots based on symmetric estimators

Authors
Citation
Dw. Shin et Hj. Kim, Semiparametric tests for double unit roots based on symmetric estimators, J BUS ECON, 17(1), 1999, pp. 67-73
Citations number
19
Categorie Soggetti
Economics
Journal title
JOURNAL OF BUSINESS & ECONOMIC STATISTICS
ISSN journal
07350015 → ACNP
Volume
17
Issue
1
Year of publication
1999
Pages
67 - 73
Database
ISI
SICI code
0735-0015(199901)17:1<67:STFDUR>2.0.ZU;2-H
Abstract
We develop new semiparametric tests for double unit roots under a weakly de pendent error structure of Phillips for tests for a unit root. The tests ar e based on symmetric estimation of Sen and Dickey. Through Monte Carlo simu lations, the new tests are compared with the tests of Haldrup and of Dickey and Pantula. Our tests have empirical sizes close to the nominal size even when the innovations follow a negatively autocorrelated moving average, fo r which the semiparametric tests of Haldrup are oversized. Moreover, our te sts have better power than the other two tests against I(1), explosive, and stationary alternatives. The tests are applied to the yearly Korean wholes ale price and consumer price indexes. Some 1(2) structure is evident for th e indexes.