Transmission electron microscopy studies of grain boundaries in InP

Citation
J. Echigoya et al., Transmission electron microscopy studies of grain boundaries in InP, J ELEC MICR, 47(6), 1998, pp. 621-626
Citations number
8
Categorie Soggetti
Multidisciplinary
Journal title
JOURNAL OF ELECTRON MICROSCOPY
ISSN journal
00220744 → ACNP
Volume
47
Issue
6
Year of publication
1998
Pages
621 - 626
Database
ISI
SICI code
0022-0744(1998)47:6<621:TEMSOG>2.0.ZU;2-J
Abstract
The grain boundary structure of undoped InP polycrystals grown from the vap our phase was characterized using electron diffraction and high-resolution electron microscopy. Most grain boundaries were tilt boundaries even though twist boundaries were also observed. The high-angle grain boundaries were mainly {111} twin boundaries. Deviation of misorientation from the exact (1 11) twin relationship was accommodated by introduction of dislocations. Inc oherent twin boundaries were also observed.