Cgh. Walker et al., High-resolution Al K alpha and high-photon energy Cr K beta-excited X-ray photoelectron spectroscopy of titanium nitride, J ELEC SPEC, 95(2-3), 1998, pp. 211-223
Citations number
38
Categorie Soggetti
Spectroscopy /Instrumentation/Analytical Sciences
Journal title
JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA
Samples of titanium nitride were magnetron sputter deposited and transferre
d in situ to be studied by X-ray photoelectron spectroscopy using high-ener
gy Cr K beta radiation and high-resolution Al K alpha radiation. The determ
ination of the Auger parameter of titanium in titanium nitride using the Ti
KLL Auger peak has been carried out at a series of compositions using the
Cr K beta radiation. The Auger parameter changes by a relatively small amou
nt with composition showing that the extra-atomic relaxation in TiNx is sim
ilar to that of the metal, and suggests that charge transfer is largely res
ponsible for the titanium core level peak shifts. The spectral structure of
the N1s photoemission peak at high-energy resolution revealed the developm
ent of multiple nitrogen environments at high nitrogen concentration, sugge
sting vacancies on the titanium sublattice or a highly defective structure.
The various titanium photoelectron and Auger peaks reveal satellites which
can be explained either by two or more local environments for the titanium
atoms in fee titanium nitride, or by a screening mechanism giving two diff
erent peaks for equivalent titanium environments. (C) 1998 Elsevier Science
B.V. All rights reserved.