On the X-ray induced chemical reduction of CeO2 as seen with X-ray photoemission spectroscopy

Authors
Paparazzo, E Ingo, GM
Citation
E. Paparazzo et Gm. Ingo, On the X-ray induced chemical reduction of CeO2 as seen with X-ray photoemission spectroscopy, J ELEC SPEC, 95(2-3), 1998, pp. 301-304
Citations number
21
Categorie Soggetti
Spectroscopy /Instrumentation/Analytical Sciences
Journal title
JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA
ISSN journal
03682048 → ACNP
Volume
95
Issue
2-3
Year of publication
1998
Pages
301 - 304
Database
ISI
SICI code
0368-2048(199810)95:2-3<301:OTXICR>2.0.ZU;2-G
Abstract
A recent X-ray photoemission spectroscopy(XPS) study (M.V. Rama Rao and T. Shripathi, J. Electron Spectrosc. Relat. Phenom., 87 (1997) 121) on X-ray i rradiated ceria stated that hydroxyl groups play a meaningful role in enhan cing the chemical reduction of this oxide and that chemical damage mainly i nvolves layers lying at depths that are larger than photoelectron attenuati on lengths. We comment upon this paper, and show that the experimental evid ence therein presented by the authors does not warrant these conclusions. ( C) 1998 Elsevier Science B.V. All rights reserved.