Special issue on high-level test synthesis

Authors
Agrawal, VD
Citation
Vd. Agrawal, Special issue on high-level test synthesis, J ELEC TEST, 13(2), 1998, pp. 75-75
Categorie Soggetti
Eletrical & Eletronics Engineeing
Journal title
JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS
ISSN journal
09238174 → ACNP
Volume
13
Issue
2
Year of publication
1998
Pages
75 - 75
Database
ISI
SICI code
0923-8174(199810)13:2<75:SIOHTS>2.0.ZU;2-N