High-Level Test Synthesis (HLTS), a term introduced in recent years, promis
es automatic enhancement of testability of a circuit. In this paper we will
show how HLTS can achieve higher testability for BIST-oriented test method
ologies. Our results show considering testability during high-level synthes
is, better testability can be obtained when compared to DFT at low level. T
ransformation for testability, which allows behavioral modification for tes
tability, is a very powerful HLTS technique.