This paper reviews failure analysis methods and discusses the merits and pi
tfalls associated with some of the more common techniques as they relate to
electrostatic discharge (ESD). Although advanced methods such as the focus
ed ion beam will be discussed, the importance of more traditional methods s
uch as liquid crystal, emission microscopy, passive voltage contrast and me
chanical polishing will be emphasized. Case histories are based on ESD rela
ted failure analysis; however, many of the references cover general failure
analysis methodology. (C) 1998 Elsevier Science Ltd. All rights reserved.