ESD failure analysis methodology

Authors
Citation
J. Colvin, ESD failure analysis methodology, MICROEL REL, 38(11), 1998, pp. 1705-1714
Citations number
70
Categorie Soggetti
Eletrical & Eletronics Engineeing
Journal title
MICROELECTRONICS AND RELIABILITY
ISSN journal
00262714 → ACNP
Volume
38
Issue
11
Year of publication
1998
Pages
1705 - 1714
Database
ISI
SICI code
0026-2714(199811)38:11<1705:EFAM>2.0.ZU;2-9
Abstract
This paper reviews failure analysis methods and discusses the merits and pi tfalls associated with some of the more common techniques as they relate to electrostatic discharge (ESD). Although advanced methods such as the focus ed ion beam will be discussed, the importance of more traditional methods s uch as liquid crystal, emission microscopy, passive voltage contrast and me chanical polishing will be emphasized. Case histories are based on ESD rela ted failure analysis; however, many of the references cover general failure analysis methodology. (C) 1998 Elsevier Science Ltd. All rights reserved.