ESD issues in compound semiconductor high-frequency devices and circuits

Authors
Bock, K
Citation
K. Bock, ESD issues in compound semiconductor high-frequency devices and circuits, MICROEL REL, 38(11), 1998, pp. 1781-1793
Citations number
49
Categorie Soggetti
Eletrical & Eletronics Engineeing
Journal title
MICROELECTRONICS AND RELIABILITY
ISSN journal
00262714 → ACNP
Volume
38
Issue
11
Year of publication
1998
Pages
1781 - 1793
Database
ISI
SICI code
0026-2714(199811)38:11<1781:EIICSH>2.0.ZU;2-Y
Abstract
The need of ESD protection for high frequency devices and circuits is under lined by reviewing the compound semiconductor material properties with emph asis on ESD stress and by collecting their ESD failure thresholds. Basic re quirements for possible ESD protection structures in the microwave frequenc y regime are discussed and possible ESD protection devices and circuit conc epts are proposed. (C) 1998 Elsevier Science Ltd. All rights reserved.