Characterization of surface-wave radar-absorbing material

Authors
Niemand, P Odendaal, JW
Citation
P. Niemand et Jw. Odendaal, Characterization of surface-wave radar-absorbing material, MICROW OPT, 20(2), 1999, pp. 131-132
Citations number
4
Categorie Soggetti
Optics & Acoustics
Journal title
MICROWAVE AND OPTICAL TECHNOLOGY LETTERS
ISSN journal
08952477 → ACNP
Volume
20
Issue
2
Year of publication
1999
Pages
131 - 132
Database
ISI
SICI code
0895-2477(19990120)20:2<131:COSRM>2.0.ZU;2-3
Abstract
A new method to characterize absorber material in a free-space facility is proposed. Materials are characterized in terms of both their specular refle ction and creeping-wave performance, using a conducting cylinder as the ref erence target. The difference in time delay bern een the specular and creep ing wave allows the use of time-domain techniques to evaluate the performan ce of the material (C) 1999 John Wiley & Sons, Inc.