Nanoparticle manipulation by mechanical pushing: underlying phenomena and real-time monitoring

Citation
C. Baur et al., Nanoparticle manipulation by mechanical pushing: underlying phenomena and real-time monitoring, NANOTECHNOL, 9(4), 1998, pp. 360-364
Citations number
14
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science","Material Science & Engineering
Journal title
NANOTECHNOLOGY
ISSN journal
09574484 → ACNP
Volume
9
Issue
4
Year of publication
1998
Pages
360 - 364
Database
ISI
SICI code
0957-4484(199812)9:4<360:NMBMPU>2.0.ZU;2-3
Abstract
Experimental results that provide new insights into nanomanipulation phenom ena are presented. Reliable and accurate positioning of colloidal nanoparti cles on a surface is achieved by pushing them with the tip of an atomic for ce microscope under control of software that compensates for instrument err ors. Mechanical pushing operations can be monitored in real time by acquiri ng simultaneously the cantilever deflection and the feedback signal (cantil ever non-contact vibration amplitude). Understanding of the underlying phen omena and real-time monitoring of the operations are important for the desi gn of strategies and control software to manipulate nanoparticles automatic ally. Manipulation by pushing can be accomplished in a variety of environme nts and materials. The resulting patterns of nanoparticles have many potent ial applications, from high-density data storage to single-electron electro nics, and prototyping and fabrication of nanoelectromechanical systems.