P. Skipirzepski et P. Nowak, Optimization of the optical granularity measurement conditions of model photographic layers, OPT APPL, 28(3), 1998, pp. 173-181
Computer results of the model dependence of the measured optical granularit
y on the area of the measuring aperture are presented. The optical granular
ity is expressed as a standard deviation of the optical density fluctuation
s. A spherical shape of the silver grains was assumed in the theoretical mo
del of the developed photographic layer. The microdensitometric measurement
s were simulated assuming various conditions. This model and the results ob
tained are intended to help to further develop an integrated simulation sys
tem for research on the structurometric properties of silver-halide photogr
aphic layers.