Optimization of the optical granularity measurement conditions of model photographic layers

Citation
P. Skipirzepski et P. Nowak, Optimization of the optical granularity measurement conditions of model photographic layers, OPT APPL, 28(3), 1998, pp. 173-181
Citations number
6
Categorie Soggetti
Optics & Acoustics
Journal title
OPTICA APPLICATA
ISSN journal
00785466 → ACNP
Volume
28
Issue
3
Year of publication
1998
Pages
173 - 181
Database
ISI
SICI code
0078-5466(1998)28:3<173:OOTOGM>2.0.ZU;2-G
Abstract
Computer results of the model dependence of the measured optical granularit y on the area of the measuring aperture are presented. The optical granular ity is expressed as a standard deviation of the optical density fluctuation s. A spherical shape of the silver grains was assumed in the theoretical mo del of the developed photographic layer. The microdensitometric measurement s were simulated assuming various conditions. This model and the results ob tained are intended to help to further develop an integrated simulation sys tem for research on the structurometric properties of silver-halide photogr aphic layers.