Temperature dependence of carrier relaxation in strain-induced quantum dots

Citation
M. Brasken et al., Temperature dependence of carrier relaxation in strain-induced quantum dots, PHYS REV B, 58(24), 1998, pp. R15993-R15996
Citations number
21
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
PHYSICAL REVIEW B-CONDENSED MATTER
ISSN journal
01631829 → ACNP
Volume
58
Issue
24
Year of publication
1998
Pages
R15993 - R15996
Database
ISI
SICI code
0163-1829(199812)58:24<R15993:TDOCRI>2.0.ZU;2-D
Abstract
We report experimental observation and theoretical interpretation of temper ature-dependent, time-resolved luminescence from strain-induced quantum dot s. The experimental results are well described by a master equation model f or the electrons. The intraband relaxation in the conduction band and the r adiative recombination rate are governed by the hole populations resulting in prominent temperature dependence of the relaxation process. Even when on ly a few electrons and holes are confined in a single quantum dot the Auger -like process provides a rapid intraband relaxation channel for electrons t hat can replace the phonon scattering as the dominant relaxation mechanism. [S0163-1829(98)51148-4].