The (100) textured diamond films have been successfully deposited on alumin
um nitride (AlN) ceramics by hot filament chemical vapor deposition. The pr
operties of the films grown for different times and various substrate tempe
ratures were characterized by X-ray diffraction and scanning electron micro
scopy. It can be clearly found that the growth rate of films on [100]-direc
tion is higher than that of [111]-direction, and the textured degree increa
ses with increasing deposition time. The highest textured degree can reach
as high as 94.5% for a him grown for 75 h. (C) 1998 Elsevier Science S.A. A
ll rights reserved.