QUADRATIC TEMPERATURE-DEPENDENCE OF RESIS TIVITY IN ND2-XCEXCUO4-DELTA THIN-FILMS IN NORMAL-STATE AND MAGNETIC SCATTERING

Authors
BABUSHKINA NA BELOVA LM ZHERNOV AP TRUBITSYN VI IVANOV AA CHURKIN OA
Citation
Na. Babushkina et al., QUADRATIC TEMPERATURE-DEPENDENCE OF RESIS TIVITY IN ND2-XCEXCUO4-DELTA THIN-FILMS IN NORMAL-STATE AND MAGNETIC SCATTERING, Fizika nizkih temperatur, 22(11), 1996, pp. 1260-1264
Citations number
24
Categorie Soggetti
Physics, Applied
Journal title
Fizika nizkih temperatur → ACNP
ISSN journal
01326414
Volume
22
Issue
11
Year of publication
1996
Pages
1260 - 1264
Database
ISI
SICI code
0132-6414(1996)22:11<1260:QTORTI>2.0.ZU;2-1
Abstract
Temperature dependence of resistivity rho(T) in normal state was studi ed for electron superconductors Nd2-xCexCuO4-delta in the cerium conce ntration range x = 0.12-0.20. For each of the investigated samples the rho(T) dependence is of the form: rho(T) = rho(0) + AT(2). With incre asing the cerium content the contribution of the quadratic term in rho (T) and the values of residual resistivity rho(0) decrease. The behavi or of rho(T) is qualitatively explained by the magnetic scattering of carriers by spin correlations, which is responsible for the quadratic dependence of rho(T).