The radiation damage imparted to highly dispersed silica by ion bombardment
may be stabilized by performing the bombardment in a controlled atmosphere
. The native defects resulting from the bombardment are the silicon-link va
cancy (which in the absence of relaxation can be described as a tetraradica
l center (=SiO.)(4), though it is expected to relate via formation of perox
idic bridges), and the oxygen-bridge vacancy (which in the absence of relax
ation can be described as a diradical center (=Si-.)(2) - the E " center).
These radicals react with the residual atmosphere according to completely n
ew pathways: the bombardment in a CO2 atmosphere results in the formation o
f ester-like and carboxylate groups, stable up to 500 degrees C at least, i
nserted in the SiO2 network at the oxygen-bridge vacancies. The bombardment
in a C2H4 atmosphere results in more complex configurations: the oxygen-br
idge vacancy reacts at room temperature with ethylene forming a Lewis adduc
t which, after heating at 500 degrees C, presumably reverts to a -CH2-CH2-
bridge in between silicon atoms; the silicon-link vacancy likely reacts wit
h C2H4 forming CH3CHO. These conclusions, based on experimental data (mainl
y infrared spectroscopy), are also supported by extended quantum mechanical
calculations (density-functional methods and ab initio molecular dynamics)
.