In order to investigate specific DNA damage caused by nitric oxide (NO) ind
uced lipid peroxidation, levels of promutagenic etheno adducts 1,N-6-etheno
deoxyadenosine (epsilon dA) and 3,N-4-ethenodeoxycytidine (epsilon dC) were
measured in spleen DNA of SJL mice induced to produce high levels of NO by
injection of RcsX (pre-B-cell lymphoma) cells. epsilon dA and epsilon dC l
evels were quantified by an ultrasensitive immunoaffinity-P-32-post-labelin
g method. Spleen DNA of control mice (n = 5) had background levels of 9.2 /- 5.4 epsilon dA adducts per 10(9) dA and 13.1 +/- 5.7 epsilon dC adducts
per 10(9) dC, In RcsX cell-injected mice (n = 7), levels of these adducts w
ere elevated similar to 6-fold, i.e, 53.9 +/- 39.4 epsilon dA per 10(9) dA
and 83.5 +/- 57.8 epsilon dC per 10(9) dC (P < 0.05). Mice injected with Rc
sX cells and also treated with N-G-methyl-L-arginine (NMA), an inhibitor of
inducible nitric oxide synthase (n = 6), had significantly reduced levels
(P < 0.05) of both epsilon dA and epsilon dC (13.5 +/- 5.7 epsilon dA per 1
0(9) dA and 28.2 +/- 15.7 epsilon dC per 10(9) dC), These findings constitu
te the first available evidence of formation of etheno adducts associated w
ith NO overproduction irt vivo. The adducts were presumably formed from lip
id peroxidation products such as trans-4-hydroxy-2-nonenal (HNE), generated
via oxidation of lipids by peroxynitrite. The results suggest that etheno-
DNA adducts, among other types of damage, may contribute to the etiology of
cancers associated with chronic infection/inflammation in which NO is over
produced.