A GaAs MOSFET with a liquid phase oxidized gate

Citation
Jy. Wu et al., A GaAs MOSFET with a liquid phase oxidized gate, IEEE ELEC D, 20(1), 1999, pp. 18-20
Citations number
15
Categorie Soggetti
Eletrical & Eletronics Engineeing
Journal title
IEEE ELECTRON DEVICE LETTERS
ISSN journal
07413106 → ACNP
Volume
20
Issue
1
Year of publication
1999
Pages
18 - 20
Database
ISI
SICI code
0741-3106(199901)20:1<18:AGMWAL>2.0.ZU;2-1
Abstract
Low leakage current density (as low as 10(-8) A/cm(2) at an applied voltage of 5 V) and high breakdown electrical held (larger than 4.5 MV/cm) of the liquid phase chemical-enhanced oxidized GaAs insulating layer enable the ap plication to the GaAs MOSFET, The oxide layer is found to the composite of Ga2O3, As, and As2O3. The n-channel depletion mode GaAs MOSFET's are demons trated and the I-V curves with complete pinch-off and saturation characteri stics can be seen. A transconductance larger than 30 mS/mm can be achieved which is even better than those of the MESFET's fabricated on the same wafe r structure.