Growth conditions, electrical resistivity, microhardness and thermal properties of Nb5Sn2Ga single crystals synthesized from high-temperature tin solutions

Citation
S. Okada et al., Growth conditions, electrical resistivity, microhardness and thermal properties of Nb5Sn2Ga single crystals synthesized from high-temperature tin solutions, J ALLOY COM, 281(2), 1998, pp. 160-162
Citations number
6
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
JOURNAL OF ALLOYS AND COMPOUNDS
ISSN journal
09258388 → ACNP
Volume
281
Issue
2
Year of publication
1998
Pages
160 - 162
Database
ISI
SICI code
0925-8388(199812)281:2<160:GCERMA>2.0.ZU;2-W
Abstract
Single crystals of a new ternary intermetallic compound Nb5Sn2Ga were prepa red from high-temperature tin solutions by a self flux method using Nb and Ga metals as starting materials under a He gas. The crystal was examined by X-ray diffraction and chemical analyses. The ternary single crystals Nb5Sn 2Ga were generally obtained in the form of prismatic shape extending in the [001] direction, and with (100) and (110) faces. The Vickers microhardness value on (001) plane and (100) or (110) planes of crystals is in the range of 8.5-10.1 Cpa. The electrical resistivity determined on crystal is in th e range of 253.1-276.7 mu Omega cm. The oxidation of Nb5Sn2Ga crystal start s at about 562 degrees C. The final oxidation products were NbO2, Nb12O29, Nb2O5, SnO2 and Ga2O3. (C) 1998 Elsevier Science S.A. All rights reserved.