We investigated the influence of a Cr underlayer on the structure and magne
tic properties of Nd-Fe-B thin films which were produced by a conventional
rf sputtering method, The thickness of the underlayer and the substrate tem
perature were varied from 0 to 5000 Angstrom and from room temperature to 6
70 degrees C, respectively. It was found that the thickness of the underlay
er material and the substrate temperature strongly influenced the crystal o
rientation and magnetic properties. The main crystalline phase was Nd2Fe14B
, whose tetragonal c-axis was aligned perpendicularly to the film plane. A
high coercive force (H-c = 3.7 kOe) was achieved using the following condit
ions: Cr underlayer with a thickness of 500 Angstrom and a substrate temper
ature of 650 degrees C. From TEM observation, this enhanced coercive force
is thought to be attributable to a modification of the columnar structure.
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