Studies on the materials development of Ga1 - xInxAsySb1 - y alloys for the
rmophotovoltaic (TPV) devices are reported. Ga1 - xInxAsySb1 - y epilayers
were grown lattice-matched to GaSb substrates by organometallic vapor-phase
epitaxy (OMVPE) using all organometallic precursors including triethylgall
ium, trimethylindium, tertiarybutylarsine, and trimethylantimony with dieth
yltellurium and dimethylzinc as the n- and p-type dopants, respectively. Th
e epilayer characteristics of these alloys depend on growth temperature, In
and As content, V/III ratio, and substrate misorientation. A mirror-like s
urface morphology and room-temperature photoluminescence (PL) are obtained
for GaInAsSb layers with peak emission in the wavelength range between 2 an
d 2.5 mu m. The material properties of the metastable alloys improve for gr
owth temperature decreasing from 575 degrees C to 525 degrees C and with de
creasing In and As content, as based on epilayer surface morphology, X-ray
diffraction, and low-temperature PL spectra. In general, GaInAsSb layers gr
own on (1 0 0)GaSb substrates with a 6 degrees toward (1 1 1)B misorientati
on exhibit overall better material quality than layers grown on the more st
andard substrate (1 0 0) 2 degrees toward (1 1 0). Consistent growth of hig
h-performance lattice-matched GaInAsSb TPV devices is also demonstrated. (C
) 1998 Published by Elsevier Science B.V, All rights reserved.