W. Strupinski et al., Selective area metalorganic vapor phase epitaxy growth of prism-shaped GaAs resonators for folded cavity surface emitting lasers, J CRYST GR, 195(1-4), 1998, pp. 474-478
Selective area (SA) metalorganic vapor phase epitaxy (MOVPE) proves to be a
n effective method of manufacturing nonplanar structures with precisely con
trolled sizes and orientations of their facets. Excellent flatness of the f
acets makes SA MOVPE especially useful for optoelectronic applications such
as microcavities. In this work we use this technique to grow prism-shaped
GaAs cavities for novel prismatic (folded) cavity surface emitting laser di
odes. Design of these devices has been recently proposed. Critical points i
n growing the cavities are: (i) to ensure 90 degrees angle at the top of th
e prism, (ii) to obtain flat walls of the GaAs prism (4 mu m wide at the ba
se) with the sharp top, (iii) to avoid an excessive number of polycrystalli
ne precipitates on the surface of a dielectric mask (SiO2 100 nm thick) des
pite the very disadvantageous ratio of openings to whole substrate area. Gr
owth-rate calculations have been performed using total area of mask opening
s as an active substrate surface. For proper prism growth the pulsing epita
xy technique using Aixtron MOVPE LP system was applied, where interruption
growth periods which enabled efficient surface molecules migration into ope
nings. Optimization of the growth/interruption time versus partial pressure
of gallium was essential for laser application to obtain suitable shape of
the prisms. The best results for 2 mu m high prisms were obtained for 272
pulses of 2 s growth/3 s interruption, when total pressure and temperature
were 100 mbar and 700 degrees C, respectively. (C) 1998 Elsevier Science B.
V. All rights reserved.