C. Tian et Cr. Vidal, Electron impact ionization of N-2 and O-2: contributions from different dissociation channels of multiply ionized molecules, J PHYS B, 31(24), 1998, pp. 5369-5381
Citations number
34
Categorie Soggetti
Physics
Journal title
JOURNAL OF PHYSICS B-ATOMIC MOLECULAR AND OPTICAL PHYSICS
The cross sections of ionic products due to the electron impact ionization
of N-2 and O-2 have been measured for the electron energies from threshold
up to 600 eV. The contributions to the cross sections from the possible rea
ction channels after the multiple ionization of molecules are also determin
ed. The experiment shows that for both N-2 and O-2 the singly charged fragm
ent N+ or O(+)originates mainly (similar to 70%) from the contribution of t
he dissociation of the singly charged parent ions, whereas the doubly charg
ed fragments N+ or O2+ are mainly (similar to 70%) from the dissociation ch
annel of doubly ionized N-2 into N2+ + N or O-2 into O2+ + O, respectively.
At high electron energies, 85% of singly ionized N-2 molecules stabilize i
nto N-2(+), whereas about 70% of singly ionized O-2 molecules stabilize int
o O-2. More than 80% of doubly ionized N-2 and O-2 molecules dissociate thr
ough the equal charge separation channel. However, after triple ionization,
most of the molecules dissociate into two charged fragments. The experimen
t also shows that the total cross sections for the different ionization sta
ges decrease exponentially as the ionization stage increases.