We propose and demonstrate a new practical method for measuring the to
tal/diffuse hemispherical reflectances and simultaneously reflected ra
diance factor of diffuse reflective substrates. This method involves t
he use of a collimated and focused monochromatic light beam and a spec
ified integrating-sphere detector. The reflected radiance factor can b
e computed from the differential of the reflectance as a function of t
he polar angle.