Optical constants measurement of single-layer thin films on transparent substrates

A reflection and transmission technique is described, which allows the dete rmination of the absorption coefficient spectrum, the refractive index disp ersion, and the thickness of thin films on transparent substrates. The meth od may be used at any angle of incidence for s-polarized or p-polarized lig ht. The absorption spectrum and the refractive index spectrum of a neat rho damine 6G dye film on a fused silica substrate are determined. The absorpti on cross-section spectrum of the film is compared with the monomeric dye ab sorption cross-section spectrum in highly diluted solution. (C) 1998 Elsevi er Science B.V. All rights reserved.