HIGH F(MAX) N-TYPE SI SIGE MODFETS

Citation
M. Gluck et al., HIGH F(MAX) N-TYPE SI SIGE MODFETS, Electronics Letters, 33(4), 1997, pp. 335-337
Citations number
6
Categorie Soggetti
Engineering, Eletrical & Electronic
Journal title
ISSN journal
00135194
Volume
33
Issue
4
Year of publication
1997
Pages
335 - 337
Database
ISI
SICI code
0013-5194(1997)33:4<335:HFNSSM>2.0.ZU;2-O
Abstract
The authors report on the fabrication of 0.18 mu m gale length n-type Si/Si60Ge40 modulation-doped field-effect transistors (MODFETs) with i mproved RF performance. The 2D electron gas channel, a strained Si lay er grown on a relaxed 2 mu m thick graded Si60Ge40 buffer shows high m obility (mu = 1190cm(2)/Vs at room temperature). High DC transconducta nces (up to 270mS/mm at room temperature), high saturation currents (2 60mA/mm) due to reduced parasitic series resistances (R-S less than or equal to 0.2 Omega mm) and high carrier densities (n(s) = 1.9 x 10(12 )cm(-2)) are achieved. Very good RF characteristics have been found fo r the non-recessed device structure with cutoff frequencies up to f(T) = 46GHz and a record of f(max) = 81GHz at low supply voltages around 1.5V.