The fluorine contamination on MgO(100) surfaces is studied using Electron S
timulated Desorption (ESD) and Auger Electron Spectroscopy (AES). While Ar ion sputtering is very effective to clean the carbon contamination on the
surface, the fluorine content does not significantly decrease. Thermal trea
tments of the sample considerably increase the F surface concentration due
to its diffusion from the bulk to the surface. Healing the sample at 700 K
simultaneously with H2O exposure produces a decrease in the fluorine signal
. The ion kinetic energy distribution of the F+ ion shows two peaks at 2.4
and 5 eV. The threshold energy of the F+ ion desorption is at 60 eV. (C) 19
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