Study of fluorine contamination on MgO(100) surfaces

Citation
I. Colera et al., Study of fluorine contamination on MgO(100) surfaces, VACUUM, 52(1-2), 1999, pp. 103-108
Citations number
17
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science","Material Science & Engineering
Journal title
VACUUM
ISSN journal
0042207X → ACNP
Volume
52
Issue
1-2
Year of publication
1999
Pages
103 - 108
Database
ISI
SICI code
0042-207X(199901)52:1-2<103:SOFCOM>2.0.ZU;2-#
Abstract
The fluorine contamination on MgO(100) surfaces is studied using Electron S timulated Desorption (ESD) and Auger Electron Spectroscopy (AES). While Ar ion sputtering is very effective to clean the carbon contamination on the surface, the fluorine content does not significantly decrease. Thermal trea tments of the sample considerably increase the F surface concentration due to its diffusion from the bulk to the surface. Healing the sample at 700 K simultaneously with H2O exposure produces a decrease in the fluorine signal . The ion kinetic energy distribution of the F+ ion shows two peaks at 2.4 and 5 eV. The threshold energy of the F+ ion desorption is at 60 eV. (C) 19 98 Elsevier Science Ltd. All rights reserved.